P. S. Carney, B. Deutsch, A. A. Govyadinov, and R. Hillenbrand
ACS nano 6, p.8 (2012)
Quantitative phase measurements in imaging, microscopy, and nanooptics provide information not carried in amplitude measurements alone. In this issue of ACS Nano, Honigstein et al. present a new method in phase measurement. In this Perspective, we comment on this work and more broadly on the emerging role of phase and phase measurements in nanooptics.