Revolutionizes near-field optical microscopy by providing:
- Full characterization of wave-attenuation, mode-profile & dispersion
by amplitude- & phase-resolved detection of local electromagnetic fields,
- Guaranteed performance in the entire visible range
by patented 100% background-free detection technology & ultra-stable aberration-free focusing,
- Coverage of the entire scope of plasmonics applications
by flexible illumination options, detection and focusing onto the sample or the tip.
VIS-neaSCOPE+s – provides polarization-resolved near-field mapping of local complex electromagnetic fields (amplitude & phase)
VIS-neaSCOPE+s is optimized for robust amplitude- and phase-resolved vector field mapping in the visible spectral range. It utilizes best-in-class s-SNOM technologies for near-field imaging and spectroscopy of plasmonic nanostructures and waveguide structures. VIS-neaSCOPE+s provides the most flexible beam-path configuration capable of polarization resolved-measurements, side & bottom illumination synchronized with the sample motion. It is upgradable with IR and TERS capabilities.
Typical applications & samples