Revolutionizes near-field optical microscopy by providing:
- Full characterization of wave-attenuation, mode-profile & dispersion
by amplitude- & phase-resolved detection of local electromagnetic fields,
- Guaranteed performance in the entire visible range
by patented 100% background-free detection technology & ultra-stable aberration-free focusing,
- Coverage of the entire scope of plasmonics applications
by flexible illumination options, detection and focusing onto the sample or the tip.
VIS-neaSCOPE+s – provides polarization-resolved near-field mapping of local complex electromagnetic fields (amplitude & phase)
VIS-neaSCOPE+s is optimized for robust amplitude- and phase-resolved vector field mapping in the visible spectral range. It utilizes best-in-class s-SNOM technologies for near-field imaging and spectroscopy of plasmonic nanostructures and waveguide structures. VIS-neaSCOPE+s provides the most flexible beam-path configuration capable of polarization resolved-measurements, side & bottom illumination synchronized with the sample motion. It is upgradable with IR and TERS capabilities.
Typical applications & samples
Tsesses et al. Science 361, 993 (2018)
Boroviks et al. Nature Communications 13, 3105 (2022)
Deshpande et al. Nano Letters 19, 6265 (2018)
Zhang et al. Nature Communications 13, 542 (2022)