Sets the benchmark of nanoscale IR imaging & spectroscopy:
- Universal performance on all types of materials
by simultaneous measurement of absorption & reflectivity,
- Highest throughput without compromise on quality
using fastest & most reliable s-SNOM imaging & spectroscopy,
- Unlimited configuration options (nano-FTIR, transmission, bottom illumination, photo-current...) by combining multi-port beam-path design with best patented technologies.
IR-neaSCOPE+s – enables nanoscale infrared (IR) imaging and nano-FTIR spectroscopy by detecting the light scattered from a standard AFM tip
IR-neaSCOPE+s is designed for providing complete chemical analysis and field mapping at 10 nm spatial resolution. It utilizes state-of-the-art technologies of near-field microscopy to measure both IR absorption and reflectivity, as well as amplitude and phase of local electromagnetic fields. It provides IR nanoimaging, point-spectroscopy and hyperspectral analysis with CW illumination sources as well as nano-FTIR spectroscopy using broadband lasers and synchrotron sources. IR-neaSCOPE+s excels in both organic and inorganic materials analysis providing the broadest range of demonstrated applications and novel near-field methodologies such as quantitative s-SNOM or sub-surface measurements.