neaSNOM AFM topographic resolution with characteristic test structure

Topographic AFM resolution of NeaSNOM

Sample details:

  • Si echeloned test pattern (STEPP sample of NT-MDT)
  • Surface exhibits larger terraces with step heights of approx. 30-50nm (upper image)
  • Terraces contain single monoatomic steps with a height of 0.314nm (lower image)
  • Specified average roughness of area without steps approx. 0.06nm

Results:

  • Imaged at ambient conditions
  • No signal analysis was applied, e.g. filtering (only line correction)
  • Profile of single scan line (no averaging)
  • Noise on flat area ≈0.027nm (RMS)

Topographic imaging of single-wall carbon nanotubes

Single Wall Carbon Nanotube with NeaSNOM AFM

Sample details:

  • CVD grown single-walled carbon nanotubes (SWCNTs) spincast from dispersion on Si-substrate
  • Silicon AFM tip (nominal tip radius ca. 10nm)
  • Individual SWCNTs (nominal diameter <1nm)
  • Bundles of  SWCNTs (nominal diameter >3nm)

Scan details:

  • Scan size 1×1µm, 333×333 pixel
  • Scan speed 0.33s/line, 3Hz

Results:

  • Imaged at ambient conditions
  • No signal analysis was applied, e.g. filtering (only line correction)
  • Profile of single scan line exhibits SWCNT height of <0.6nm