neaSCOPE upgrade to KpFM with fast scanning based on gradient single-path detection method allows accurate work function measurements with monolayer directivity limit and. Upgrade recommended for simultaneous measurement of reflectivity and surface potential. In combination with dual beam-path design, it enables photoexcitation and full characterization of photovoltaic samples.
Included in upgrade:
- KpFM software & hardware upgrade
- 10 conductive AFM-probes
- KpFM test sample
Application example:
Simultaneous measurement of work function and reflectivity in graphene multi-layered samples.
