neaSCOPE upgrade to KpFM with fast scanning based on gradient single-path detection method allows accurate work function measurements with monolayer directivity limit and. Upgrade recommended for simultaneous measurement of reflectivity and surface potential. In combination with dual beam-path design, it enables photoexcitation and full characterization of photovoltaic samples.

Included in upgrade:

  • KpFM software & hardware upgrade 
  • 10 conductive AFM-probes 
  • KpFM test sample 

Application example:

Simultaneous measurement of work function and reflectivity in graphene multi-layered samples.