Terahertz near-field microscopy below 30nm spatial resolution

neaspec GmbH and Fraunhofer IPM have developed a ready-to-use terahertz system that is capable of achieving a spatial resolution of 30 nanometers in combination with neaspec’s near-field microscope – neaSNOM

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Ultrafast spectroscopy of electronic nano-motion in nanowires

The neaSNOM microscope equipped with a THz illumination unit were applied in ultrafast spectroscopy to take snapshots of super-fast electronic nano-motion. The scientists were able to record a 3D movie of electrons moving at the surface of a semiconductor nanowire.

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Mapping local conductivity in semiconductor devices

Near-field microscopy at infared and terahertz frequencies allows to quantify free carrier properties at the nanoscale without the need of electrical contacts.

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