neaspec’s neaSNOM was used by researchers at the CIC nanoGUNE to visualize how light moves in time and space inside an exotic class of matter known as hyperbolic materials. For the first time, ultraslow pulse propagation and backward propagating waves in deep subwavelength-scale thick slabs of boron nitride – a natural hyperbolic material for infrared light – could be observed.
Using nano-FTIR neaSNOM it could be shown that thin-film organic semiconductors contain regions of structural disorder. These could inhibit the transport of charge and limit the efficiency of organic electronic devices.
neaspec’s neaSNOM microscope allows for launching and controlling light propagating along graphene, opening new venues for extremely miniaturized photonic devices and circuits
nano-FTIR beats the diffraction limit in infrared bio-spectroscopy and probes secondary structure in individual protein complexes
Two independent research teams have successfully used their neaSNOM infrared near-field microscopes for laying down a ghost: visualizing Dirac plasmons propagating along graphene, for the first time.
Infrared near-field microscopy allows to study the propagation of surface waves in the infrared spectral regime. Amplitude and phase resolved near-field images reveal local interference effects or enable the determination of the complex wave vector of surface waves. Surface waves can be excited in the mid-infrared spectral regime by e.g. metal structures on Silicon Carbide…
Direct verification of superlensing can be achieved by near-field microscopy as the local field transmitted by a superlens can be investigated in the near-field of the lens.
Direct visualization of infrared light transportation and nanofocusing by miniature transmission lines is possible by amplitude- and phase-resolved near-field microscopy.
Amplitude and phase resolved near-field mapping of the local field distribution on resonant IR antennas can be used to analyze the antenna design and its functionality.
The high spatial resolution of infrared near-field microscopy allows for detailed studies of phase transitions in materials like the insulator-to-metal transition of vanadium dioxide (VO2) thin films.
Mapping nanoscale stress/strain fields around nanoindents in the surface of Silicon Carbide (SiC) crystals. Compressive/tensile strain occurs in bright/dark contrast respectively.
The local conductivity of nanowires can be investigated by infrared near-field microscopy.