Thursday, October 15th 2020 - 5:00 PM (CEST)
Tapping AFM-IR+ sets the benchmark for AFM-IR techniques (also known as PiFM, PTE and PTIR), which measure local infrared absorption by detecting the photo-thermal sample expansion using AFM (Atomic Force Microscopy) cantilever response.
We will demonstrate LIVE: nanoscale chemical mapping, spectroscopy & hyperspectral imaging with 10 nm spatial resolution on polymer composites.
You will learn how neaspec achieves:
- Artefact-free absorption measurements without mechanical influence,
- Maximum performance without sample damage,
- High-quality results independent from user experience.
Hosts: Dr. Stefan Mastel & Dr. Sergiu Amarie, senior application engineers @ neaspec, would be happy to be challenged by your questions.
Register now and watch later, if you can't make it to the live session.