Revolutionizes nanoscale spectroscopy by combining nano-FTIR with nano-Raman
Provides complete vibrational analysis at the nanoscale:
Same spot for nano-FTIR and nano-Raman/PL spectroscopy
Using modular design and multi-port access to the AFM-tip
Maximum TERS signal even with standard AFM probes
by simple alignment using strong elastic light scattering from the tip
Single user interface for all measurement modes
optimized for storing and organizing multidimensional correlative data
IR-neaSCOPE+TERs combines nano-FTIR with TERS and Photoluminescence (PL) spectroscopy for an ultimate characterization using elastic and inelastic light scattering from the same nanoscale spot. It allows for simple alignment procedure using complementary IR or visible scattering, which delivers robust nanoscale Raman and PL performance even with standard metallized AFM tips.
Visualize the distribution of nano-materials by selective single-frequency maps and ratios.
Reveals propagating surface plasmon-polaritons in real-space.
Nanoscale Chemical Identification
Identify unknown nano-materials by matching measured spectra with an ATR IR database.
Vectorial Field Mapping
Resolves the vectorial character of local complex electromagnetic fields (amplitude & phase).
Phase Transition Imaging
Studies phase transition materials by sequential imaging at different sample temperatures.
Typical applications & samples
|nano-FTIR Illumination Unit for Spectroscopy||650-2200 cm-1|
|nano-FTIR Illumination Unit for Spectroscopy||2400-4200 cm-1|
|Tunable Near-Field Illumination Unit||850-1800 cm-1|
|Near-Field Illumination Unit (TERS compatible)||532 nm|
|Near-Field Illumination Unit (TERS compatible)||633 nm|
|Topography, Mechanical amplitude & phase||AFM|
|Stiffness, Adhesion, Viscosity & Energy dissipation||Tip-Force|
|Melting point detection of polymers||nano-TA|
|Heat conductivity map||SThM|
|Chemical nano-ID imaging & spectroscopy||tapping AFM-IR+|
|Photo Thermal Expansion (resonant enhanced)||PTE+|
|Photo Thermal Expansion (for thick samples)||PTE|
|neaspec nano-FTIR Scanning Probes||1 Pack = 20 pcs.|
|neaspec nano-FTIR Scanning Probes||Wafer = 380 pcs.|
|neaspec Certified Scanning Probes||1 Pack = 20 pcs.|
|Active Piezo Vibration Isolation Workstation||120 x 90 cm|
|Acoustic Enclosure||120 x 90 cm|
|Active Piezo Vibration Isolation Workstation||150 x 100 cm|
|Acoustic Enclosure||150 x 100 cm|
Automatically stores & organizes multidimensional and multi-user data
Measures up to 4 local properties simultaneously for all-in-one nanoscale analysis
Provide 100% reproducible results by completely suppressing the background
Alignment-free sample exchange for consistent measurements
Accommodates large sample sizes and weights
Allows complex measurements to be performed even by new users
Extends the scan range of the sample scanner to 8 µm in z-direction. Recommended for samples with tilted surface or high height difference
Boosts sensitivity and signal-to-noise ratio. Enables integration of low-power light-sources
Enables automatic focusing of laser to the AFM tip and one-click switching between illumination sources and measurement modes
Enables fully synchronized demodulation of up to 4 analog inputs for e.g. correlative photocurrent & photoluminescence measurements
Enables correlative single pass Kelvin Probe measurements in the same instrument
Allows monitoring & control of neaSCOPE microscope in e.g. LabVIEW or Python
All products include a proprietary AFM designed for nanoscale imaging and spectroscopy in IR, THz and visible spectral ranges.
Not sure which neaSCOPE You need? Let us help and build a neaSCOPE tailored for Your application!