Revolutionizes nanoscale spectroscopy by combining nano-FTIR with nano-Raman
IR-neaSCOPE+TERs
Provides complete vibrational analysis at the nanoscale:
Same spot for nano-FTIR and nano-Raman/PL spectroscopy
Using modular design and multi-port access to the AFM-tip
Maximum TERS signal even with standard AFM probes
by simple alignment using strong elastic light scattering from the tip
Single user interface for all measurement modes
optimized for storing and organizing multidimensional correlative data
IR-neaSCOPE+TERs combines nano-FTIR with TERS and Photoluminescence (PL) spectroscopy for an ultimate characterization using elastic and inelastic light scattering from the same nanoscale spot. It allows for simple alignment procedure using complementary IR or visible scattering, which delivers robust nanoscale Raman and PL performance even with standard metallized AFM tips.
Technology
Typical applications & samples
Available configurations
nano-FTIR Illumination Unit for Spectroscopy | 650-2200 cm-1 |
nano-FTIR Illumination Unit for Spectroscopy | 2400-4200 cm-1 |
Tunable Near-Field Illumination Unit | 850-1800 cm-1 |
Near-Field Illumination Unit (TERS compatible) | 532 nm |
Near-Field Illumination Unit (TERS compatible) | 633 nm |
Topography, Mechanical amplitude & phase | AFM |
Stiffness, Adhesion, Viscosity & Energy dissipation | Tip-Force |
Melting point detection of polymers | nano-TA |
Heat conductivity map | SThM |
Surface workfunction | KpFM |
Chemical nano-ID imaging & spectroscopy | tapping AFM-IR+ |
Photo Thermal Expansion (resonant enhanced) | PTE+ |
Photo Thermal Expansion (for thick samples) | PTE |
Mechanical Spectroscopy | MS |
neaspec nano-FTIR Scanning Probes | 1 Pack = 20 pcs. |
neaspec nano-FTIR Scanning Probes | Wafer = 380 pcs. |
neaspec Certified Scanning Probes | 1 Pack = 20 pcs. |
Active Piezo Vibration Isolation Workstation | 120 x 90 cm |
Acoustic Enclosure | 120 x 90 cm |
Active Piezo Vibration Isolation Workstation | 150 x 100 cm |
Acoustic Enclosure | 150 x 100 cm |
Included features
Measures up to 4 local properties simultaneously for all-in-one nanoscale analysis
Optional upgrades
Extends the scan range of the sample scanner to 8 µm in z-direction. Recommended for samples with tilted surface or high height difference
High NA Parabolic Mirror Objective
Boosts sensitivity and signal-to-noise ratio. Enables integration of low-power light-sources
Position Sensors for Parabolic Mirror
Enables automatic focusing of laser to the AFM tip and one-click switching between illumination sources and measurement modes
2x Additional Demodulated ADC inputs
Enables fully synchronized demodulation of up to 4 analog inputs for e.g. correlative photocurrent & photoluminescence measurements
Enables correlative single pass Kelvin Probe measurements in the same instrument
Compare models
All products include a proprietary AFM designed for nanoscale imaging and spectroscopy in IR, THz and visible spectral ranges.
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