04 Jun 2021
Dr. Artem Danilov, 12:00-13:00 (GMT+3) 4 June 2021
Title: Applications of scattering Scanning Near-field Optical Microscopy and Spectroscopy
Scanning Near-Field Optical Microscopy (SNOM) breaks the diffraction-related limitation for the optical analysis methods. Recent advancements in scattering SNOM development provide tools to perform artifact-free nanoscale optical characterization with wavelengths from VIS and IR to THz with a broad range of applications in various research fields. This talk introduces the technology of nanoFTIR and shows examples of technology utilization.