Featured Talk

Scanning Near-Field Optical Microscopy (SNOM) breaks the diffraction-related limitation for the optical analysis methods. Recent advancements in scattering SNOM development provide tools to perform artifact-free nanoscale optical characterization with wavelengths from VIS and IR to THz with a broad range of applications in various research fields. This talk introduces the technology of nanoFTIR and shows examples of technology utilization.

Here you can find more details about the seminar series at ITMO .