Nanoscale analysis of semiconductors

About this E-Book: IR nanoimaging directly probes charge carriers and provides high level of insight into device composition, doping concentration, carrier diffusion and dynamics. This E-Book will give you an overview of potential applications for device engineering, quality control & failure analysis.

• Quantitative mapping of doping concentration in InP nanowires,
• Probing femtosecond carrier dynamics in InAs nanowires,
• Correlative mechanical optical and electrical nanoscopy of SRAM devices,
• Investigation of Luttinger-liquid plasmons in single-walled carbon nanotubes.