Nanoscale analysis of semiconductors
About this E-Book: IR nanoimaging directly probes charge carriers and provides high level of insight into device composition, doping concentration, carrier diffusion and dynamics. This E-Book will give you an overview of potential applications for device engineering, quality control & failure analysis.
- Quantitative mapping of doping concentration in InP nanowires,
- Probing femtosecond carrier dynamics in InAs nanowires,
- Correlative mechanical optical and electrical nanoscopy of SRAM devices,
- Investigation of Luttinger-liquid plasmons in single-walled carbon nanotubes.