neaSNOM Microscope – Where Optical Imaging & Spectroscopy meets AFM

Based on neaspec’s revolutionary technology, neaSNOM is the only microscope on the market capable of imaging & spectroscopy in the visible, infrared and even terahertz spectral region at only 10 nm spatial resolution.

This makes neaSNOM the ideal tool for cutting-edge nanoanalytic applications such as chemical nano-composition (nano-FTIR-mode), nano-plasmonic fields, nanoscale stress/strain fields and free charge carrier distributions. Many scientists around the world trust in technology from neaspec for their publications in Nature, Science and other high impact journals.

Neaspec_NeaSNOM_microscope_nanoFTIR_sSNOM-AFM

Optimized to combine optical imaging & spectroscopy with AFM

Built-in patented optical background suppression for high-quality data

Desigend by the leading experts of apertureless near-field microscopy

Atomic Force Microscope (AFM)

  • Compact size X,Y,Z: 30 cm x 45 cm x 30 cm 
  • Coarse positioning ranges: X = 60 mm, Y = 15 mm, and Z = 8 mm
  • Coarse positioning resolution: < 200 nm
  • Scanning sample design to allow AFM-tip illumination
  • Scan-area: 100 µm x 100 µm X,Y closed-loop scan range
  • Scan-resolution X,Y: 0.2 nm (open-loop), 0.4 nm (closed-loop)
  • Scan-speed: up to 20 µm/s
  • Scan-time for e.g. 100 x 100 pixel = 1 x 1 µm image : 35s
  • Noise-limited Z-resolution (RMS): ≤ 0.2 nm 
  • Scan Z-range: 2.5 µm
  • Maximum sample size: 40 x 50 x 15 mm (X,Y,Z)

AFM Probing Head

  • Intermittent contact mode for optical background suppression
  • Ultra-high optical access to AFM tip (180° horizontal, 60° vertical)
  • Motorized positioning (X,Y,Z) for easy AFM-tip alignment
  • Positioning ranges: X = 30 mm, Y = 3 mm, and Z = 4 mm
  • Positioning resolution X,Y,Z: < 200 nm
  • Accepts AFM cantilevers up to 500 kHz resonance frequency

Optical High-Resolution Brightfield Microscope

  • Screening of region of interest (ROI) with < 0.8 µm spatial resolution
  • Field of view diagonal: 0.75 mm
  • High-speed 5 Mpixel CCD-camera

View topographic resolution test-measurement

AFM-Tip Illumination & Light Collection Unit (s-SNOM)

  • Patented parabolic mirror design for focusing & collection of light
  • Standard optical aperture NA = 0.39
  • Motorized XYZ-positioner of parabolic mirror objective for precise focusing of external light source to AFM-tip
  • Positioning ranges: X, Y, Z = 4 mm
  • Positioning resolution X,Y,Z: < 100 nm
  • Accepts visible, infrared & even THz illumination wavelength
  • Patented dual-port design for imaging & spectroscopy

Available Upgrades

Position Sensors for Motorized Parabolic Mirror

  • Enables simplified and faster focusing of light to AFM-tip
  • Adds optical sensors to X,Y,Z parabolic mirror adjustment axes
  • Sensor resolution: 10 nm

High NA Parabolic Mirror Objective

  • Improves S/N-ratio by higher numerical aperture (NA=0.46)
  • Accepts visible, infrared & even THz illumination wavelength
  • Supports patented dual-port design for nanoscale imaging & spectroscopy
  • Recommended for light-source systems with low S/N-ratio 

neaSNOM Scan Controller & Optical Signal Processing Unit

  • Synchronization of AFM mechanics with optical signals
  • Patented signal processing for optical background supression
  • Two custom ADC inputs for internal signal analysis
  • Four custom DAC outputs for external signal analysis
  • Requires neaSNOM User-PC (NPC-2) for operation

neaSNOM User PC

  • Real-time mechanical & optical signal visualization & data aquisition
  • 2 x 23” displays for user-friendly operation
  • Integrated user remote support 

neaSCAN Control & Data Acquisition Software

  • Real-time control and scan software for AFM and optical signals
  • Optical imaging and spectroscopy software modules 
  • Supports 1D, 2D and 3D scans
  • Pre-installed data visualization and analysis software (Gwyddion)