NeaSNOM – The Ultimate Nanoanalytic Microscope for Materials Research & Photonics

Based on Neaspec’s revolutionary apertureless near-field microscopy technology (s-SNOM), NeaSNOM is the only microscope on the market capable of imaging & spectroscopy in the visible, infrared and even terahertz spectral region at only 10 nm spatial resolution. This makes NeaSNOM the ideal tool for many nanoanalytic applications such as chemical nano-composition, nano-plasmonic fields, nanoscale stress/strain fields  and many more.

Optical Imaging & spectroscopy at 10nm spatial resolution based on proprietary high-stability AFM

Optical near-field detection & illumination modules tuned to your needs

From the experts of apertureless near-field microscopy

NeaSNOM platform specifications at a glance
Probing Head	Free optical access of 180° in horizontal and 60° in vertical direction Motorized loader with coarse positioning ranges X=30mm, Y=3mm, Z=4mm Down to 100nm step size, up to 10mm/s speed
Sample Positioner	Motorized loader with coarse positioning ranges X=60mm, Y=15mm, Z=8mm Down to 100nm step size, up to 10mm/s speed Sample Z-Axis Fine Positioner 3µm z-positioning range <0.2nm RMS noise-limited resolution , 1.5-150Hz
Sample X-Y Scanner	100µm x 100µm X-Y closed-loop scan range Capacitive position sensors
Upright Optical Microscope	Extra long working distance: W=20 mm 0.8 µm resolution, 0.7 mm field of view diagonal 5 Mpix digital imaging camera
Light Focussing & Collection Unit	Patented broadband parabolic mirror design Visible – terahertz wavelength range Supports dual-beam operation 2×45° (NA=0.38) usable optical aperture ≥8 mm motorized adjustment range in X, Y and Z direction
Scan Controller	1D, 2D and 3D scans with arbitrary offset and rotation Support for cantilevers with resonance frequency up to 500kHz Demodulation of up to 4 optical signal harmonics simultaneously Highest input signal frequency fc>1 Mhz at -3dB