NeaSNOM Options

Based on its modular configuration, the NeaSNOM platform can be equipped with modules for fast measurements employing single-line CW lasers, or for broadband spectroscopy with pulsed sources, or both. The operating wavelength range can be optimized for the visible, IR or THz range. Several add-ons for transmission-mode illumination of transparent samples are available.

NeaSNOM platform without modules allowing unbeatable 180° optical access to AFM probing tip NeaSNOM platform mounted at the same time with detection module for single-line lasers (left) and detection module for broadband light-sources (right)

Near-Field Detection Module for Single-Line Lasers

 
  • Optimized for single-line and tunable single-line lasers
  • Accepts lasers with visible, infrared and terahertz wavelength
  • Enables high performance near-field imaging with a single laser-line
  • Near-field spectrum aquisition possible with tunable single-line laser
  • Patented interferometric near-field signal detection method for background-free detection
  • Simultaneous measurement of optical near-field amplitude & phase
  • Integration time: 6.5 ms – 1.6 s

Near-Field Detection Module for Broadband Light-Sources

 
  • Optimized for broadband light-sources
  • Enables high performance near-field spectroscopy
  • Up to 5 spectra per second @ 60 cm-1 resolution
  • Up to 6 cm-1 spectral resolution @ 1 spectrum per second
  • New: Optional 3 cm-1  spectral resolution
  • Based on optimized Fourier-Transform spectrometer
  • Patented interferometric near-field signal detection method for background-free detection
  • Simultaneous measurement of optical near-field amplitude and phase spectra
  • Suited for visible, infrared and terahertz wavelength range

Transmissive Illumination – Fixed Focus

  • Enables bottom-side illumination (transmission mode) for transparent samples
  • Stationary focus at probing tip
  • Available for selected wavelength regions within visible, infrared and terahertz spectrum
  • Also available with parabolic mirror for broadband spectral range

Transmissive Illumination – Synchronously Moving Focus

  • Enables bottom-side illumination (transmission mode) for transparent samples
  • Stationary focal point with respect to sample surface
  • Available for two wavelengths regions: 400 nm – 1.6 µm and 8 – 14 µm

Side Camera System

Additional to the standard integrated top view camera for sample inspection, Neaspec offers a Side Camera System with clear advantages:

  • Simplified alignment of measurement laser
  • Direct observation of probing tip, e.g. contact point with sample
  • Precise targeting of small structures (e.g. TEM lamellas)
  • Monitoring tip-sample separation with µm precision
Standard built-in camera only allows top-view Side Camera System allows precise alignment (Au film on Si-Wafer with scratch)